The development of a sophisticated cardiac pacing simulator: a training tool to enhance the management of post cardiac surgical patient care
Funder: British Heart FoundationDuration: October 2020 - September 2023
People
| Name | Telephone | Office | ||
|---|---|---|---|---|
|
Professor Hongying Meng Professor (Principal investigator)
T: +44 (0)1895 265496
E: hongying.meng@brunel.ac.uk |
+44 (0)1895 265496 | hongying.meng@brunel.ac.uk | Howell Building 233 |
|
Professor Wamadeva Balachandran Research Professor
T: +44 (0)1895 265774
E: wamadeva.balachandran@brunel.ac.uk |
+44 (0)1895 265774 | wamadeva.balachandran@brunel.ac.uk | Howell Building 244 |
Outputs
Cretu, I., Tindale, A., Balachandran, W., Abbod, M., Khir, AW. and Meng, H. (2024) ''. IEEE Access, 12. pp. 133994 - 134007.
Cretu, I., Tindale, A., Abbod, M., Balachandran, W., Khir, AW. and Meng, H. (2024) ''. IJC Heart and Vasculature, 51. pp. 1 - 9. ISSN: 2352-9067
Cretu, I., Tindale, A., Abbod, M., Khir, A., Balachandran, W. and Meng, H. (2023) ''. Journal of Biomedical Engineering and Biosciences, 10. pp. 41 - 52.
Cretu, I., Tindale, A., Abbod, M., Khir, A., Balachandran, W. and Meng, H. (2023) ''.The 9th World Congress on Electrical Engineering and Computer Systems and Science (best paper award). London, UK. 3 - 5 August. Avestia Publishing. pp. ICBES 152-1 - ICBES 152-8. ISSN: 2369-811X
Faizan, M., Intzes, I., Cretu, I. and Meng, H. (2023) ''. Technologies, 11 (4). pp. 1 - 22.
Tindale, A., Cretu, I., Meng, H. and Panoulas, V. (2023) ''. European Heart Journal: Acute Cardiovascular Care, 12 (9). pp. 615 - 623. ISSN: 2048-8726
Cretu, I., Tindale, A., Abbod, M., Balachandran, W., Mason, M., Khir, AW. and et al. (2023) ''.EHRA Congress 2023. Barcelona, Spain. 24 - 18 April. Oxford University Press (OUP). pp. i1007 - i1009. ISSN: 1099-5129
Cretu, I., Tindale, A., Abbod, M., Khir, A., Mason, M., Balachandran, W. and et al. (2022) ''.2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC). Glasgow, UK. 11 - 15 July. IEEE. pp. 2647 - 2650. ISSN: 2375-7477