Dr Ian Dear
Senior Lecturer
Howell Building 223
- Email: ian.dear@brunel.ac.uk
- Tel: +44 (0)1895 266763
Morris, A., Maharaj, C., Kourmpetis, M., Dear, I., Puri, A. and Dear, J. (2009) ''. Journal of Pressure Vessel Technology, Transactions of the ASME, 131 (2). ISSN: 0094-9930
Morris, A., Kourmpetis, M., Dear, ID., Sjodahl, M. and Dear, JP. (2007) ''. Proceedings of the Institution of Mechanical Engineers, Part A: Journal of Power and Energy, 221 (8). pp. 1141 - 1152. ISSN: 0957-6509
Dear, ID., Dislis, CD., Ambler, AP. and Dick, J. (1994) ''. Journal of Electronic Testing, 5 (2-3). pp. 137 - 155. ISSN: 0923-8174
Dislis, C., Dick, JH., Dear, ID., Azu, IN. and Ambler, AP. (1993) 'Economics modeling for the determination of test strategies for complex VLSI boards'.International Test Conference 1993: Designing, Testing, and Diagnostics - Join Them. Baltimore, MD. 17 - 21 October. I E E E. pp. 210 - 217.
Dear, ID., Dislis, C., Ambler, AP. and Dick, J. (1991) ''. IEEE Design and Test of Computers, 8 (4). pp. 64 - 77. ISSN: 0740-7475